SFP Primary Cluster: Tainted Input

A category in the Common Weakness Enumeration published by The MITRE Corporation.

  • Source

    CWE Catalog - 4.14

  • Identifier

    CWE-896

  • Status

    Incomplete

Contents

Summary

Categories in the Common Weakness Enumeration (CWE) group entries based on some common characteristic or attribute.

This category identifies Software Fault Patterns (SFPs) within the Tainted Input cluster (SFP24, SFP25, SFP26, SFP27).

Categories

SFP Secondary Cluster: Faulty Input Transformation

This category identifies Software Fault Patterns (SFPs) within the Faulty Input Transformation cluster.

SFP Secondary Cluster: Incorrect Input Handling

This category identifies Software Fault Patterns (SFPs) within the Incorrect Input Handling cluster.

SFP Secondary Cluster: Tainted Input to Command

This category identifies Software Fault Patterns (SFPs) within the Tainted Input to Command cluster (SFP24).

SFP Secondary Cluster: Tainted Input to Environment

This category identifies Software Fault Patterns (SFPs) within the Tainted Input to Environment cluster (SFP27).

SFP Secondary Cluster: Tainted Input to Variable

This category identifies Software Fault Patterns (SFPs) within the Tainted Input to Variable cluster (SFP25).

Concepts

Software Fault Pattern (SFP) Clusters

CWE identifiers in this view are associated with clusters of Software Fault Patterns (SFPs).

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